• Micron Technology, Inc. (Boise, ID)
    …skills + Develop expert level microscopy skills ( Focused Ion Beam ( FIB ), Scanning Electron Microscope ( SEM ), CSAM, X-RAY) + Work shift is ... TBD - Shift and Hours flexibility (position requires day to night shift rotations in intervals of 4 months) **Education & Experience:** + 5+ years to applicable experience, or applicable Engineering BS **Desired Behaviors:** + Demonstrate teamwork,… more
    DirectEmployers Association (11/19/25)
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  • NY CREATES (Albany, NY)
    …maintain advanced analytical tools, including Scanning Electron Microscopes ( SEM ), Focused Ion Beam ( FIB ) systems, Transmission Electron ... in semiconductor failure analysis or analytical lab settings. Proficiency with Dual- Beam FIB systems, high-resolution SEM , and advanced TEM tools. Prior… more
    job goal (12/11/25)
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  • Micron Technology, Inc. (Boise, ID)
    …and advance faster than ever. We are looking to add a team member to our Scanning Electron Microscope ( SEM ) team who will contribute by applying ... operation and minor maintenance of SEMs and Dual Beams ( FIB / SEM ), sample preparation for SEMs, and communicate...Ensure safe operation of the acid hood, sputter coaters, ion millers, UV cleaners, etchers, and micro-cleaving tools +… more
    DirectEmployers Association (12/09/25)
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  • NY CREATES (Albany, NY)
    …Job responsibilities include, but are not limited to : Effective day-to-day operation of SEM , FIB and TEM instruments for analytical work Perform SEM ... analysis on samples submitted by requesting partners and on-site customers Perform FIB - SEM and FIB prep of TEM samples from requesting customer base Perform… more
    job goal (12/13/25)
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  • Micron Technology, Inc. (Boise, ID)
    …issues. + Perform physical failure analysis, including sample preparation and microscopy ( FIB , SEM , CSAM, X-Ray). + Apply statistical tools to analyze ... **OR** 5+ years of relevant experience. + Proficiency in microscopy techniques ( FIB , SEM , CSAM, X-Ray). + Experience with statistical analysis tools for yield… more
    DirectEmployers Association (11/14/25)
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  • NY CREATES (Albany, NY)
    …performance, stability, and sources of anomalies. Offline measurement techniques may include SEM , TEM prep and FIB . The candidate must execute project-based ... of advanced structures through means such as optical metrology, X-Ray metrology, electron microscopy, and/or hybrid metrologies and analysis of measurement… more
    job goal (12/11/25)
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  • ExxonMobil (Spring, TX)
    …+ Experience with one or more of the following additional microanalysis tools: SEM , FIB , TEM, SIMS, x-ray CT, optical microscopy. + Experience applying ... using advanced microscopy techniques. + Operation and maintenance of an Electron Microprobe (EPMA). + Support other microanalysis instruments and sample preparation… more
    DirectEmployers Association (12/10/25)
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  • Micron Technology, Inc. (Boise, ID)
    …gaps and implementing strategic improvements. + Hands-on experience operating and troubleshooting SEM , Dual Beam FIB , TEM, and deprocessing equipment ... within a semiconductor manufacturing or analysis environment. As a world leader in the semiconductor industry, Micron is dedicated to your personal wellbeing and professional growth. Micron benefits are designed to help you stay well, provide peace of mind and… more
    DirectEmployers Association (12/06/25)
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  • Ralliant (Beaverton, OR)
    …of materials science and associated analytical techniques to isolate failure modes. Utilized SEM with EDS and/or FIB in analyzing failed components. + ASQ ... Certified Reliability Engineer \#LI-RB **Ralliant Corporation Overview** Ralliant, originally part of Fortive, now stands as a bold, independent public company driving innovation at the forefront of precision technology. With a global footprint and a legacy of… more
    DirectEmployers Association (11/26/25)
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  • FIB Technician

    Adecco US, Inc. (Santa Clara, CA)
    …. Understand the basic principles of scanning electron microscopy ( SEM ), focused ion beam ( FIB ), and transmission electron microscopy ... Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures and… more
    Adecco US, Inc. (11/07/25)
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  • FIB Technician

    Applied Materials (Hillsboro, OR)
    …+ Understand the basic principles of scanning electron microscopy ( SEM ), focused ion beam ( FIB ), and transmission electron microscopy ... operating reactors to perform thin film processes, and using scanning electron microscopes for analyses and imaging....electron microscope (TEM) lamella samples using focused ion beam ( FIB more
    Applied Materials (11/07/25)
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  • FIB / SEM Process Technician

    Insight Global (Albany, NY)
    …etch, preferably in a high-volume manufacturing facility. - 1 year of experience with SEM tools in a lab environment - Associate's degree or equivalent - Experience ... with troubleshooting and maintaining vacuum-based processing equipment. - Skilled in the use of Microsoft Office applications (Outlook, Word, Excel, and PowerPoint). Must be legally authorized to work in US without sponsorship more
    Insight Global (12/09/25)
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  • Senior Failure Analysis Engineer

    NVIDIA (Santa Clara, CA)
    …for silicon inspection, cross-section, delayering, material analysis ( Scanning Electron Microscope , Focused Ion Beam , Nanoprobing, etc.) is a ... and operate EFA tools such as Curve Tracer, Emission-based analytical tools, Laser Scanning Microscopy, and imaging tools (3D Xray, CSAM, etc.) for fault isolation… more
    NVIDIA (10/14/25)
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  • Field Service Engineer II ( SEM ) - Onsite

    ThermoFisher Scientific (Hillsboro, OR)
    … Microscopy employees, using hardware, software, and applications expertise in the electron , ion , and light microscopy fields, significantly help guide our ... technical experience installing, repairing, and calibrating tools such as SEM , TEM, FIB , Probers, or similar systems **Knowledge, Skills, Abilities** + Detailed… more
    ThermoFisher Scientific (11/13/25)
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  • Senior Field Service Engineer ( SEM /LDB)

    ThermoFisher Scientific (Buffalo, NY)
    …+ 8+ years of experience in ** SEM (https://www.thermofisher.com/search/browse/category/us/en/90184058?gptExactMatch=true) , FIB ... systems, specifically for our Materials and Structural Analysis (MSD) ** Electron Microscopy (https://www.thermofisher.com/us/en/home/ electron -microscopy.html)** (EM) business that designs,… more
    ThermoFisher Scientific (11/12/25)
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  • Failure Analysis Technician

    NY CREATES (Albany, NY)
    …maintain advanced analytical tools, including Scanning Electron Microscopes ( SEM ), Focused Ion Beam ( FIB ) systems, Transmission Electron ... in semiconductor failure analysis or analytical lab settings. + Proficiency with Dual- Beam FIB systems, high-resolution SEM , and advanced TEM tools. + Prior… more
    NY CREATES (11/25/25)
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  • Field Applications Engineer (Semiconductor)

    ThermoFisher Scientific (Hillsboro, OR)
    …hands-on experience with Dual Beam , focused ion beam scanning and electron microscopy ( FIB / SEM ), or Transmission Electron Microscopy ... Transmission Electron Microscopes, Scanning Electron Microscopes, and/or Dual Beam / Focused Ion Beam Technology and are familiar in one of… more
    ThermoFisher Scientific (11/20/25)
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  • Junior Semiconductor Materials Engineer

    Battelle Memorial Institute (Columbus, OH)
    …for materials characterization, electrical, and/or structural characterization: focused ion beam ( FIB ), scanning electron microscopy ( SEM ), ... light microscopy. + Intellectual curiosity and a passion for science and technology + Must be a US Citizen and be willing and able to obtain a DoD Top Secret/SCI security clearance **Preferred Qualifications** + Master's degree with (2) or more years… more
    Battelle Memorial Institute (12/06/25)
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  • Intern, R&D Undergraduate Summer - TITANS…

    Sandia National Laboratories (Albuquerque, NM)
    …circuit issues (failure analysis) + Focused Ion Beam ( FIB ) tools + Scanning Electron Microscopy ( SEM ) + Laser Scanning Microscopy (LSM) ... larger family, namely Technical Internships To Advance National Security (TITANS), focused solely on cybersecurity, software, hardware and math analytics. TITANS… more
    Sandia National Laboratories (11/14/25)
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  • Technical Manager URNANO

    University of Rochester (Rochester, NY)
    scanning electron microscopes ( SEM ), electron spectroscopy (ie EDS), focused ion beam ( FIB ) preparation of samples, transmission ... electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing, soft/hard… more
    University of Rochester (11/06/25)
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