- NY CREATES (Albany, NY)
- …JOB SUMMARY NY CREATES is seeking applicants for the position Metrology SEM/ FIB / TEM Analysis Technician to work in its 300mm semiconductor development ... facilities. This position is responsible for off-line SEM/ TEM & FIB characterization analysis of structures and devices fabricated on 300mm Si wafers. The… more
- ThermoFisher Scientific (Chicago, IL)
- …and improve operational quality of system equipment; Transmission Electron Microscopy ( TEM ), Scanning Electron Microscopy (SEM), Small/Large Dual Beam (SDB/LDB); ... Experience: + Operating, troubleshooting, repairing and calibrating complex analysis tools such as SEM, TEM , FIB , Prober or similar systems is a plus but not… more
- ThermoFisher Scientific (Hillsboro, OR)
- …and improve operational quality of system equipment; Transmission Electron Microscopy ( TEM ), Scanning Electron Microscopy (SEM), Small/Large Dual Beam (SDB/LDB); ... Experience: + Operating, troubleshooting, repairing and calibrating complex analysis tools such as SEM, TEM , FIB , Prober or similar systems is a plus but not… more
- ThermoFisher Scientific (Hillsboro, OR)
- …experience installing, solving, repairing and calibrating complex analysis tools such as SEM, TEM , FIB , Prober, or similar systems. + Proven ability to diagnose ... handling of spare parts: ordering, usage, returns, physical count, trunk stock management , etc. + Maintains technical proficiency level for servicing our instrument… more
- ThermoFisher Scientific (Dallas, TX)
- …on sophisticated systems, or equivalent military experience + Prior experience using SEM, TEM , FIB , Circuit Analysis, or similar systems + Ability to partner ... effectively with customers + Excellent interpersonal communication skills; must have a professional working proficiency in English + High level of proficiency on Windows software, network knowledge, current computer hardware + Must have ability to obtain a… more
- Micron Technology, Inc. (Boise, ID)
- …in the electron microscope field and state-of-art focused ion beam ( FIB ) machines for the preparation of TEM specimens. TEM lab is designing ... will be focusing on daily FIB operation, TEM sample preparation, and FIB TEM...new technology development at Micron from wafer receiving, wafer management , maintaining systems ready for operation to sample-to-data completion.… more
- Applied Materials (Santa Clara, CA)
- …process system. + Prepare transmission electron microscope ( TEM ) lamella samples using focused ion beam ( FIB ), optimize sample preparation procedures ... Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy ( TEM ). + Perform… more
- NVIDIA (Santa Clara, CA)
- …of integrated circuits at various stages of the design and manufacturing process by performing focused ion beam ( FIB ) circuit editing. You will work ... circuit modifications at the transistor and interconnect level using focused ion beam ( FIB...perform various FIB sample preparation tasks for TEM , nanoprobing, and e- beam probing. + Tool… more
- Micron Technology, Inc. (Boise, ID)
- …in the electron microscope field and state-of-art focused ion beam ( FIB ) machines for the preparation of TEM specimens. We are looking for a TEM ... supporting our global community. Are you passionate about transmission electron microscopy ( TEM )? Micron has an outstanding Corporate TEM lab under Technology… more
- Micron Technology, Inc. (Boise, ID)
- …in Boise, Idaho, is equipped with the most advanced Transmission Electron Microscopes (TEMs) and Focused Ion Beam ( FIB ) machines available. Here, you ... the Role:** We are seeking a dedicated and skilled TEM Engineer to join our world-class team. You will...with process and integration engineers, data scientists, and other TEM experts to develop and apply innovative TEM… more
- ManpowerGroup (Albany, NY)
- **Job** Description: **Job: Transmission Electron Microscope ( TEM ) Technician** **Team: Physical Characterization and Failure Analysis group** **Location: Albany, ... testing will be preferred. The candidate needs to independently perform TEM analysis on hardware created by state-of-the-art semiconductor technology, including EUV… more
- ThermoFisher Scientific (Thousand Oaks, CA)
- …and improve operational quality of system equipment; Transmission Electron Microscopy ( TEM ), Scanning Electron Microscopy (SEM), Small/Large Dual Beam (SDB/LDB); ... Experience: + Operating, troubleshooting, repairing and calibrating complex analysis tools such as SEM, TEM , FIB , Prober or similar systems is a plus but not… more
- Pacific Northwest National Laboratory (Richland, WA)
- …under dynamic conditions. + Skilled in using focused ion beam ( FIB ) for TEM sample preparation and familiar with complementary techniques like AFM, ... solid-state ionic + Conduct advanced electron microscopy research by preparing optimal samples using Focused Ion Beam ( FIB ) techniques. + Collaborate… more
- IBM (Albany, NY)
- …or June - September for quarter system schools. The graduate student candidate will use both focused ion beam ( FIB ) tools to prepare sample of thin ... films and TEM microscopes to determine microstructure of these thin films...Expertise + Experience with preparation of thin lamellas using focused ion beam tools. +… more
- Principal Service Solutions (Albany, NY)
- …samples and cleaving/analysis instructions from the Process Engineering staff + Lamella preparation using Focused Ion Beam ( FIB ) tools + Sample ... Service Solutions is hiring a Process Technicians with previous hands on FIB and/or STEM/ TEM semiconductor processing experience in a high-volume manufacturing… more
- University of Rochester (Rochester, NY)
- …equipment such as a Scanning Electron Microscope (SEM), Focused Ion Beam ( FIB ), Transmission Electron Microscope ( TEM ), and other analysis equipment ... employment, more time will be devoted to sample preparation. 70% SEM/ TEM / FIB /SQUID analysis: The Scientist will be required to exercise independent technical… more
- Pacific Northwest National Laboratory (Richland, WA)
- …vapor deposition techniques and prepare TEM and APT samples using a plasma focused ion beam ( FIB ) for microscopic evaluation. + Prepare samples using ... subjected to extreme environments. You will be involved in cutting-edge research programs focused on developing new materials, as well as tools and methods for… more
- KBR (Wright Patterson AFB, OH)
- …the analysis and maturation of advanced microelectronics. Tasks will include: 1) Hands-on use of Focused Ion Beam ( FIB ) and Scanning Electron Microscope ... 2 years of experience in the related field *Experience using SEM and/or FIB equipment *Experience using common optical microscopes *Ability to think critically to… more
- Iowa State University (Ames, IA)
- …(S/ TEM ), electron energy loss spectroscopy (EELS), energy dispersive spectroscopy (EDS), and focused ion beam ( FIB ) techniques. Required Minimum ... microscopy imaging, diffraction studies and analytical investigations of low-Z and beam sensitive materials. Our systems include natural clays, micas, and related… more
- Micron Technology, Inc. (Boise, ID)
- …of analytical instrumentation including: + Atom Probe Tomography (APT) + Dual Beam Focused Ion Beam ( FIB ) + Scanning Electron Microscopy (SEM) ... + Transmission Electron Microscopy ( TEM ) Excellent technical, communication, and analytical skills **Responsibilities:** Partner with Surface Scientists to evaluate… more