- Applied Materials (Santa Clara, CA)
- …+ Understand the basic principles of scanning electron microscopy ( SEM ), focused ion beam ( FIB ), and transmission electron microscopy ... electron microscope (TEM) lamella samples using focused ion beam ( FIB...identify cutting locations based on pattern instructions. + Operate metrology tools in the FIB & TEM… more
- Applied Materials (Santa Clara, CA)
- …after training. + Understand basic scanning electron microscopy ( SEM )/ Focused Ion Beam ( FIB )/Transmission electron microscopy (TEM) ... electron microscope (TEM) lamella samples by focused ion beam ( FIB...identify cutting location based on pattern instructions. + Operate metrology tools in FIB & TEM lab… more