- Western Digital (San Jose, CA)
- …experience with site-specific sample preparation and experience with new generation TFS FIB tools is required. In-depth understanding of FIB automation is ... engineers that will analyze the lamella. + To increase access to our busy FIB instruments, we ask the candidate to work on Monday-Friday 6am-3pm or 2pm-11pm shift,… more
- NVIDIA (Santa Clara, CA)
- …of integrated circuits at various stages of the design and manufacturing process by performing focused ion beam ( FIB ) circuit editing. You will work ... Perform precise circuit modifications at the transistor and interconnect level using focused ion beam ( FIB ) and other advanced techniques to… more
- Applied Materials (Albany, NY)
- …of the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy (TEM).… more
- Applied Materials (Santa Clara, CA)
- …of the process system. + Prepare transmission electron microscope (TEM) lamella samples using focused ion beam ( FIB ), optimize sample preparation ... training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), and transmission electron microscopy (TEM).… more
- Micron Technology, Inc. (Boise, ID)
- …Idaho. We have the most advanced TEMs available in the electron microscope field and state-of-art focused ion beam ( FIB ) machines for the preparation of ... environment, it requires advanced knowledge of semiconductor industry background, FIB hands-on experience with computing language coding capability. The candidate… more
- IBM (Albany, NY)
- …or June - September for quarter system schools. The graduate student candidate will use both focused ion beam ( FIB ) tools to prepare sample of thin ... and Professional Expertise + Experience with preparation of thin lamellas using focused ion beam tools. + Experience with precession electron diffraction… more
- Applied Materials (Albany, NY)
- …after training. + Understand the basic principles of scanning electron microscopy (SEM), focused ion beam ( FIB ), transmission electron microscopy ... Make Possible **(R)** a Better Future.Responsibilities: + Responsible for daily TEM/ FIB /SEM operation, analysis data acquisition, and provide timely, high quality… more
- ThermoFisher Scientific (Hillsboro, OR)
- …automated alignment and calibration software for dual- beam (scanning electron microscope/ focused ion beam ) microscopes that enables scientists, engineers ... and testing infrastructure for automated alignment and calibration software for dual- beam microscopes. + Collaborate across time zones with software and systems… more
- Applied Materials (Santa Clara, CA)
- …customers and team members to optimize experiments and explain results. **Qualifications:** Experience on Focused Ion Beam ( FIB ) for TEM sample ... preparation. 2+ years' experience on FIB /SEM/TEM tool operation Strong problem-solving skills Outstanding oral and verbal communication skills Ability to work in a… more
- University of Rochester (Rochester, NY)
- …working knowledge of state-of-the-art scanning electron microscopes (SEM), electron spectroscopy (ie EDS), focused ion beam ( FIB ) preparation of samples, ... transmission electron microscopy (TEM), physical vapor deposition tools, reactive ion (plasma) processing, wafer scale silicon and associated oxide processing,… more
- Micron Technology, Inc. (Boise, ID)
- …analytical instrumentation including: + Atom Probe Tomography (APT) + Dual Beam Focused Ion Beam ( FIB ) + Scanning Electron Microscopy (SEM) + ... Transmission Electron Microscopy (TEM) Excellent technical, communication, and analytical skills **Responsibilities:** Partner with Surface Scientists to evaluate and improve sample preparation and analysis techniques. Work with multi-functional teams to… more
- ThermoFisher Scientific (Hillsboro, OR)
- …a background working with Transmission Electron Microscopes, Scanning Electron Microscopes, or Dual Beam / Focused Ion Beam Technology and are familiar ... in one of those scientific areas - we are looking for you: + Life Sciences (Cell and Structural Biology) + Material Science (Metals, Alloys, Composites, Ceramics) + Semiconductor (Metrology and Failure Analysis) **How will you make an impact in our team?**… more
- Argonne National Laboratory (Lemont, IL)
- …MPMS. The successful candidate will be responsible for fabrication of suitable samples using focused ion - beam systems or electron beam lithography. Some ... amount of modeling and simulation work will be required. **Position Requirements** + PhD in materials science, physics or closely related field; received within the last 5 years or upcoming year. + Experience working with Lorentz Transmission Electron… more
- Argonne National Laboratory (Lemont, IL)
- …Experience with high pressure diamond anvil cell technology and/or nanofabrication tools (particularly focused ion beam and lithography) + Familiarity with ... x-ray measurements. This instrument will take advantage of the sub-micrometer beam size, advanced x-ray polarization control, high magnetic field, low temperature,… more
- University of Rochester (Rochester, NY)
- …magnetic analyses of samples using equipment such as a Scanning Electron Microscope (SEM), Focused Ion Beam ( FIB ), Transmission Electron Microscope ... more time will be devoted to sample preparation. 70% SEM/TEM/ FIB /SQUID analysis: The Scientist will be required to exercise...laboratory instrument including but not limited to SEM, TEM, FIB and SQUID magnetometer instruments at the UR and… more
- Sandia National Laboratories (Albuquerque, NM)
- …analysis + Prototype assembly + Identifying and fixing integrated circuit issues (failure analysis) + Focused Ion Beam ( FIB ) tools + Scanning Electron ... want to have a career in cybersecurity. We are focused on developing the next generation of experts in...national security and technology innovation, with teams of specialists focused on cutting-edge work in a broad array of… more
- Pacific Northwest National Laboratory (Richland, WA)
- …with typical solid material characterization tools including microscopy (SEM, EBSD, EDS, and optical microscopy), focused ion beam ( FIB ) SEM for TEM and ... materials characterization (SEM, EBSD, EDS, and optical microscopy). Experience using a FIB -SEM for sample preparation for TEM and APT analysis. + Experience with… more
- KBR (Wright Patterson AFB, OH)
- …the analysis and maturation of advanced microelectronics. Tasks will include: 1) Hands-on use of Focused Ion Beam ( FIB ) and Scanning Electron Microscope ... 2 years of experience in the related field *Experience using SEM and/or FIB equipment *Experience using common optical microscopes *Ability to think critically to… more
- Battelle Memorial Institute (Columbus, OH)
- …analysis + Signal Processing + Familiarity with operation of laboratory equipment; for example: Focused Ion Beam ( FIB ) systems, Scanning Electron ... Microscopes (SEM), or integrated circuits (IC), or sample preparation equipment + Experience with microscopy in a laboratory setting + Must be a US Citizen with the ability to obtain and maintain a US government security clearance **Preferred Qualifications**… more
- Actalent (Rockville, MD)
- …and processes, including but not limited to scanning electron microscopy (SEM), focused ion beam ( FIB ) cross-section, ellipsometry/reflectometry, ... automated optical inspection (AOI), atomic force microscopy (AFM), confocal & optical microscopy/inspection, IR Spectroscopy, contact and non-contact profilometry, or similar techniques. + Previous experience in successful MEMS or related semiconductor… more